Title |
RF Breakdown of 805 MHz Cavities in Strong Magnetic Fields |
Authors |
- D.L. Bowring, A.V. Kochemirovskiy, M.A. Leonova, A. Moretti, M.A. Palmer, D.W. Peterson, K. Yonehara
Fermilab, Batavia, Illinois, USA
- B.T. Freemire
IIT, Chicago, Illinois, USA
- A.A. Haase
SLAC, Menlo Park, California, USA
- P.G. Lane, Y. Torun
Illinois Institute of Technology, Chicago, Illinois, USA
- D. Stratakis
BNL, Upton, Long Island, New York, USA
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Abstract |
Ionization cooling of intense muon beams requires the operation of high-gradient, normal-conducting RF structures in the presence of strong magnetic fields. We have measured the breakdown rate in several RF cavities operating at several frequencies. Cavities operating within solenoidal magnetic fields B > 0.25 T show an increased RF breakdown rate at lower gradients compared with similar operation when B = 0 T. Ultimately, this breakdown behavior limits the maximum safe operating gradient of the cavity. Beyond ionization cooling, this issue affects the design of photoinjectors and klystrons, among other applications. We have built an 805 MHz pillbox-type RF cavity to serve as an experimental testbed for this phenomenon. This cavity is designed to study the problem of RF breakdown in strong magnetic fields using various cavity materials and surface treatments, and with precise control over sources of systematic error. We present results from tests in which the cavity was run with all copper surfaces in a variety of magnetic fields.
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Paper |
download MOAD2.PDF [0.813 MB / 4 pages] |
Slides |
download MOAD2_TALK.PDF [10.792 MB] |
Export |
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Conference |
IPAC2015, Richmond, VA, USA |
Series |
International Particle Accelerator Conference (6th) |
Proceedings |
Link to full IPAC2015 Proccedings |
Session |
Contributed Orals (MC7) |
Date |
04-May-15 14:00–15:00 |
Main Classification |
7: Accelerator Technology |
Sub Classification |
T06 - Room Temperature RF |
Keywords |
cavity, Windows, operation, controls, klystron |
Publisher |
JACoW, Geneva, Switzerland |
Editors |
Stuart Henderson (ANL, Argonne, IL, USA); Evelyn Akers (Jlab, Newport News, VA, USA); Todd Satogata (JLab, Newport News, VA, USA); Volker R.W. Schaa (GSI, Darmstadt, Germany) |
ISBN |
978-3-95450-168-7 |
Published |
June 2015 |
Copyright |
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