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Title Fast Image Analysis for Beam Profile Measurement at the European XFEL
  • J. Wilgen, B. Beutner
    DESY, Hamburg, Germany
Abstract At the European XFEL, images of scintillator screens are processed at a rate of 10 Hz. Dedicated image analysis servers are used for transversal beam profile analysis as well as for longitudinal profile and slice emittance measurement. This contribution describes the setup and the algorithms used for image analysis.
Paper download THPHA031.PDF [1.130 MB / 4 pages]
Poster download THPHA031_POSTER.PDF [1.161 MB]
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Conference ICALEPCS2017, Barcelona, Spain
Series International Conference on Accelerator and Large Experimental Control Systems (16th)
Proceedings Link to full ICALEPCS2017 Proccedings
Session Poster Session
Date 12-Oct-17   16:45–19:00
Main Classification Data Analytics
Keywords ion, FEL, emittance, electron, ion-effects
Publisher JACoW, Geneva, Switzerland
Editors Volker RW Schaa (GSI, Darmstadt, Germany); Isidre Costa (ALBA-CELLS, Cerdanyola del Vallès, Spain); David Fernández (ALBA-CELLS, Cerdanyola del Vallès, Spain); Óscar Matilla (ALBA-CELLS, Cerdanyola del Vallès, Spain)
ISBN 978-3-95450-193-9
Published January 2018
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