The Joint Accelerator Conferences Website (JACoW) is an international collaboration that publishes the proceedings of accelerator conferences held around the world.
|Title||High Repetition-Rate Electro-optic Sampling: Recent Studies Using Photonic Time-Stretch|
|Abstract||Single-shot electro-optic sampling (EOS) is a powerful characterization tool for monitoring the shape of electron bunches, and coherent synchrotron radiation pulses. For reaching high acquisition rates, an efficient possibility consists to associate classic EOS systems with the so-called photonic time-stretch technique . We present recent results obtained at SOLEIL and ANKA using this strategy. In particular, we show how a high sensitivity variant of photonic time stretch  EOS enabled to monitor the CSR pulses emitted by short electron bunches at SOLEIL . We could thus confirm in a very direct way the theories predicting an interplay between two physical processes. Below a critical bunch charge, we observe a train of identical THz pulses stemming from the shortness of the electron bunches. Above this threshold, CSR emission is dominated by drifting structures appearing through spontaneous self-organization. We also consider the association of time-stretch and EOS for recording electron bunch near fields at high repetition rate. We present preliminary results obtained at ANKA, aiming at recording the electron bunch shape evolution during the microbunching instability.|
|Footnotes & References|| F. Coppinger et al. IEEE Trans. Microwave Theory Tech. 47, 1309 (1999).
 C. Szwaj et al., Rev. Sci. Instruments 87, 103111 (2016).
 C. Evain et al., Phys. Rev. Lett. 118, 054801 (2017).
|Paper||download TU1AB2.PDF [2.556 MB / 4 pages]|
|Slides||download TU1AB2_TALK.PDF [72.925 MB]|
|Export||download ※ BibTeX ※ LaTeX ※ Text/Word ※ RIS ※ EndNote|
|Conference||IBIC2017, Grand Rapids, MI, USA|
|Series||International Beam Instrumentation Conference (6th)|
|Proceedings||Link to full IBIC2017 Proccedings|
|Session||Tuesday Before Coffee|
|Main Classification||4 Time-Resolved Diagnostics and Synchronization|
|Keywords||ion, electron, photon, laser, bunching|
|Publisher||JACoW, Geneva, Switzerland|
|Editors||Zhengzheng Liu (FRIB, East Lansing, MI, USA); Steven Lidia (FRIB, East Lansing, MI, USA); Amy McCausey (FRIB, East Lansing, MI, USA); Volker RW Schaa (GSI, Darmstadt, Germany)|