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Title High Repetition-Rate Electro-optic Sampling: Recent Studies Using Photonic Time-Stretch
  • S. Bielawski, M. Le Parquier
    PhLAM/CERCLA, Villeneuve d'Ascq Cedex, France
  • E. Blomley, E. Bründermann, S. Funkner, A.-S. Müller, M.J. Nasse, G. Niehues, M. Schuh, P. Schönfeldt, J.L. Steinmann, S.W. Walter
    KIT, Eggenstein-Leopoldshafen, Germany
  • J.B. Brubach, L. Manceron, P. Roy, M.-A. Tordeux
    SOLEIL, Gif-sur-Yvette, France
  • C. Evain, C. Szwaj
    PhLAM/CERLA, Villeneuve d'Ascq, France
  • N. Hiller
    PSI, Villigen PSI, Switzerland
  • E. Roussel
    Elettra-Sincrotrone Trieste S.C.p.A., Basovizza, Italy
Abstract Single-shot electro-optic sampling (EOS) is a powerful characterization tool for monitoring the shape of electron bunches, and coherent synchrotron radiation pulses. For reaching high acquisition rates, an efficient possibility consists to associate classic EOS systems with the so-called photonic time-stretch technique [1]. We present recent results obtained at SOLEIL and ANKA using this strategy. In particular, we show how a high sensitivity variant of photonic time stretch [2] EOS enabled to monitor the CSR pulses emitted by short electron bunches at SOLEIL [3]. We could thus confirm in a very direct way the theories predicting an interplay between two physical processes. Below a critical bunch charge, we observe a train of identical THz pulses stemming from the shortness of the electron bunches. Above this threshold, CSR emission is dominated by drifting structures appearing through spontaneous self-organization. We also consider the association of time-stretch and EOS for recording electron bunch near fields at high repetition rate. We present preliminary results obtained at ANKA, aiming at recording the electron bunch shape evolution during the microbunching instability.
Footnotes & References [1] F. Coppinger et al. IEEE Trans. Microwave Theory Tech. 47, 1309 (1999).
[2] C. Szwaj et al., Rev. Sci. Instruments 87, 103111 (2016).
[3] C. Evain et al., Phys. Rev. Lett. 118, 054801 (2017).
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Conference IBIC2017, Grand Rapids, MI, USA
Series International Beam Instrumentation Conference (6th)
Proceedings Link to full IBIC2017 Proccedings
Session Tuesday Before Coffee
Date 22-Aug-17   09:00–10:30
Main Classification 4 Time-Resolved Diagnostics and Synchronization
Keywords ion, electron, photon, laser, bunching
Publisher JACoW, Geneva, Switzerland
Editors Zhengzheng Liu (FRIB, East Lansing, MI, USA); Steven Lidia (FRIB, East Lansing, MI, USA); Amy McCausey (FRIB, East Lansing, MI, USA); Volker RW Schaa (GSI, Darmstadt, Germany)
ISBN 978-3-95450-192-2
Published March 2018
Copyright © 2018 by JACoW, Geneva, Switzerland     CC-BY Creative Commons License
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