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https://doi.org/10.18429/JACoW-FLS2018-TUP2WD03
Title Turn-by-Turn Measurements for Systematic Investigations of the Micro-Bunching Instability
Authors
  • J.L. Steinmann, M. Brosi, E. Bründermann, M. Caselle, S. Funkner, B. Kehrer, A.-S. Müller, M.J. Nasse, G. Niehues, L. Rota, M. Schuh, P. Schönfeldt, M. Siegel, M. Weber
    KIT, Karlsruhe, Germany
Abstract While recent diffraction-limited storage rings provide bunches with transverse dimensions smaller than the wavelength of the observed synchrotron radiation, the bunch compression in the longitudinal plane is still challenging. The benefit would be single cycle pulses of coherent radiation with many orders of magnitude higher intensity. However, the self-interaction of a short electron bunch with its emitted coherent radiation can lead to micro-bunching instabilities. This effect limits the bunch compression in storage rings currently to the picosecond range. In that range, the bunches emit coherent THz radiation corresponding to their bunch length. In this paper, new measurement setups developed at the Karlsruhe Institute of Technology are described for systematic turn-by-turn investigations of the micro-bunching instability. They lead to a better understanding thereof and enable appropriate observation methods in future efforts of controlling and mastering the instability. Furthermore, the described setups might also be used as high repetition rate bunch compression monitors for bunches of picosecond length and below.
Funding Funded by the German Federal Ministry of Education and Research (Grant No. 05K16VKA) & Initiative and Networking Fund of the Helmholtz Association (contract number: VH-NG-320).
Paper download TUP2WD03.PDF [2.375 MB / 6 pages]
Slides download TUP2WD03_TALK.PDF [8.524 MB]
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Conference FLS2018, Shanghai, China
Series ICFA Advanced Beam Dynamics Workshop (60th)
Proceedings Link to full FLS2018 Proccedings
Session WG-D
Date 06-Mar-18   16:00–18:00
Main Classification D - Key Technologies
Keywords ion, detector, radiation, synchrotron, diagnostics
Publisher JACoW Publishing, Geneva, Switzerland
Editors Yong Ho Chin (KEK, Tsukuba, Japan); Zhentang Zhao (SINAP, Shanghai, China); Christine Petit-Jean-Genaz (CERN, Geneva, Switzerland); Volker RW Schaa (GSI, Darmstadt, Germany)
ISBN 978-3-95450-206-6
Published June 2018
Copyright
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cc Creative Commons Attribution 3.0