Paper  Title  Other Keywords  Page 

SUPB001  Analyzing Surface Roughness Dependence of Linear RF Losses  SRF, superconductivity, scattering, niobium  1 


Funding: Authored by Jefferson Science Associates, LLC under U.S. DOE Contract No. DEAC0506OR23177. Topographic structure on Superconductivity Radio Frequency (SRF) surfaces can contribute additional cavity RF losses describable in terms of surface RF reflectivity and absorption indices of wave scattering theory. At isotropic homogeneous extent, Power Spectrum Density (PSD) of roughness is introduced and quantifies the random surface topographic structure. PSD obtained from different surface treatments of niobium, such as Buffered Chemical Polishing (BCP), Electropolishing (EP), NanoMechanical Polishing (NMP) and Barrel Centrifugal Polishing (CBP) are compared. A perturbation model is utilized to calculate the additional rough surface RF losses based on PSD statistical analysis. This model will not consider that superconductor becomes normal conducting at fields higher than transition field. One can calculate the RF power dissipation ratio between rough surface and ideal smooth surface within this field range from linear loss mechanisms. 

MOPB018  Analyzing Surface Roughness Dependence of Linear RF Losses  SRF, superconductivity, scattering, niobium  210 


Funding: Authored by Jefferson Science Associates, LLC under U.S. DOE Contract No. DEAC0506OR23177. Topographic structure on Superconductivity Radio Frequency (SRF) surfaces can contribute additional cavity RF losses describable in terms of surface RF reflectivity and absorption indices of wave scattering theory. At isotropic homogeneous extent, Power Spectrum Density (PSD) of roughness is introduced and quantifies the random surface topographic structure. PSD obtained from different surface treatments of niobium, such as Buffered Chemical Polishing (BCP), Electropolishing (EP), NanoMechanical Polishing (NMP) and Barrel Centrifugal Polishing (CBP) are compared. A perturbation model is utilized to calculate the additional rough surface RF losses based on PSD statistical analysis. This model will not consider that superconductor becomes normal conducting at fields higher than transition field. One can calculate the RF power dissipation ratio between rough surface and ideal smooth surface within this field range from linear loss mechanisms. 
