Author: Phillips, H.L.
Paper Title Page
MOPB060 RF Surface Impedance Characterization of Potential New Materials for SRF-based Accelerators 312
  • B. P. Xiao, G.V. Eremeev, H.L. Phillips, C.E. Reece
    JLAB, Newport News, Virginia, USA
  • M.J. Kelley, B. P. Xiao
    The College of William and Mary, Williamsburg, USA
  Funding: Authored by Jefferson Science Associates, LLC under U.S. DOE Contract No. DE-AC05-06OR23177.
In the development of new superconducting materials for possible use in SRF-based accelerators, it is useful to work with small candidate samples rather than complete resonant cavities. The recently commissioned Jefferson Lab rf Surface Impedance Characterization (SIC) system* can presently characterize the central region of 50 mm diameter disk samples of various materials from 2 to 40 K exposed to RF magnetic fields up to 14 mT at 7.4 GHz. We report the measurement results from bulk Nb, thin film Nb on Cu and sapphire substrates, and thin film MgB2 on sapphire substrate provided by colleagues at JLab and Temple University. We also report on efforts to extend the operating range to higher fields.
* B.P. Xiao, et al., RSI, 2011. 82: p. 056104