Author: Palczewski, A.D.
Paper Title Page
MOPB062 A New Internal Optical Profilometry System for Characterization of RF Cavity Surfaces – CYCLOPS 318
  • C.E. Reece, A.D. Palczewski, H. Tian
    JLAB, Newport News, Virginia, USA
  Funding: Authored by Jefferson Science Associates, LLC under U.S. DOE Contract No. DE-AC05-06OR23177.
Jefferson Lab has received and commissioned a new interferometric optical profilometer specifically designed to provide internal surface mapping of elliptical rf cavities. The CavitY CaLibrated Optical Profilometry System – CYCLOPS – provides better than 2 micron lateral resolution and 0.1 micron surface height resolution of programmatically selected locations on the interior surface of multi-cell cavities. The system is being used to provide detailed characterization of surface topographic evolution as a function of applied surface treatments and to investigate particular localized defects. We also intend to use the system for 3D mapping of actual interior rf surface geometry for feedback to structure design model and fabrication tooling. First uses will be illustrated. CYCLOPS was developed and fabricated by MicroDynamics Inc., Woodstock, GA, USA.