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Title Development of an Ionization Profile Monitor Based on a Pixel Detector for the CERN Proton Synchrotron
  • J.W. Storey, D. Bodart, B. Dehning, S. Levasseur, P. Pacholek, A. Rakai, M. Sapinski, G. Schneider, D. Steyart
    CERN, Geneva, Switzerland
  • K. Satou
    JAEA/J-PARC, Tokai-Mura, Naka-Gun, Ibaraki-Ken, Japan
Abstract The transverse emittance measurement in the CERN Proton Synchrotron is currently performed using fast rotational wire scanners. These scanners cannot provide continuous bunch-by-bunch measurements and the expected future increase of the beam brightness will lead to an accelerated sublimation of the wire. A novel Ionization Profile Monitor is being constructed to cope with these challenges. The readout of this device will be based on a hybrid silicon pixel detector with a Timepix3 chip. Pixel detectors are sensitive to single electrons therefore eliminating the need for traditional Multi-Channel Plates, which suffer from ageing phenomena. The early digitization of the signal will reduce the susceptibility of the readout system to electromagnetic interference, while the time resolution of the chip allows the required bunch-by-bunch measurement. Due to the small length of the detector a new, simplified ion trap has been designed. Resistive glass plates are used to provide maximum uniformity of the electric field and to simplify construction. The guiding field will be provided by a new, self-compensating magnet. It is foreseen to have the device ready for testing with beam in 2016.
Paper download TUPB059.PDF [0.599 MB / 4 pages]
Conference IBIC2015, Melbourne, Australia
Series International Beam Instrumentation Conference (4th)
Proceedings Link to full IBIC2015 Proccedings
Session Poster Session 2
Date 15-Sep-15   16:00–18:00
Main Classification Transverse Profile Monitors
Keywords detector, electron, radiation, ion, cathode
Publisher JACoW, Geneva, Switzerland
Editors Mark Boland (SLSA, Clayton, Australia); David Button (ANSTO, Menai, Australia); Kathleen Riches (SLSA, Clayton, Australia); Volker RW Schaa (GSI, Darmstadt, Germany)
ISBN 978-3-95450-176-2
Published January 2016
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